Silicon Transmission Series Detection Module
Photoluminescence (PL) testing is a non-contact inspection method based on optical excitation and high-sensitivity camera imaging, widely used for quality inspection of silicon wafers, solar cells, and other semiconductor materials.
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10WOutput Power
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1064±5nmCentral Emission Wavelength
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10nmSpectral Width
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Product Advantages
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Applications
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Specification
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Related Products
Product Advantages
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Non-Contact Inspection
PL testing employs a non-destructive approach, ensuring zero physical damage or contamination to silicon wafers while maintaining sample integrity during inspection.
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High Sensitivity
Capable of detecting defects and impurities at micron- and even nano-scale levels, PL testing offers significantly higher sensitivity than conventional methods.
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Rapid and Efficient
PL testing enables high-throughput sample processing, dramatically improving production efficiency and quality control effectiveness.
Applications
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Inspection Module Camera Capture Diagram -
PV Inspection Module -
PV Inspection
Specification
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450nm—100W
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Model Number（W）
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Wavelength（nm）
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Center Wavelength Deviation
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Average Power（W）
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Typical Working Distance（mm）
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Dimensions of the Optical Outlet（mm）
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Detectable Wafer Size（mm）
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Power Requirements（V）
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IO Interface
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Average Power Consumption（W）
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Outgoing Light Control Mode
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Power Regulation Mode
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Operating Temp.&Rh（℃）
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Controller Size（mm）
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Optical Module Size（mm）
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Weight（kg）
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Applicable Technology
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450nm—100W
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Model Number（W）15
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Wavelength（nm）1064
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Center Wavelength Deviation±5
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Average Power（W）15
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Typical Working Distance（mm）10~25
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Dimensions of the Optical Outlet（mm）280×10
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Detectable Wafer Size（mm）≤230
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Power Requirements（V）220
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IO InterfaceWhite 0~24V+/ Black 0~0.5V-
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Average Power Consumption（W）150
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Outgoing Light Control ModeCode SwitchIO Interface
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Power Regulation ModeCode Switch
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Operating Temp.&Rh（℃）20~30；＜80%
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Controller Size（mm）218×122×111
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Optical Module Size（mm）316×33×138
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Weight（kg）≈4
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Applicable TechnologyRaw Silicon Wafers and Tufting Wafers
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