1060nm Semiconductor Laser
Photovoltaic cell inspection and testing is a non-contact detection method based on optical excitation and high-sensitivity camera imaging, which is widely applied in quality inspection of silicon wafers, solar cells, and other semiconductor materials.
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15W~70WOutput Power
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1060±10nmCentral Emission Wavelength
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6nmSpectral Width
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Product Advantages
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Specification
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Related Products
Product Advantages
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High Conversion Efficiency
Utilizing advanced semiconductor fabrication processes to achieve superior electro-optic conversion efficiency, reducing power consumption while delivering high output power.
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Outstanding Wavelength Characteristics
The 1060nm wavelength offers excellent tissue penetration capability, making it ideal for various medical and aesthetic applications.
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High Power Output
Delivering power output ranging from several watts to tens of watts, with customizable options for different application requirements.
Specification
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1060-15W
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1060-70W
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Output Power（W）
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Central Emission Wavelength（nm）
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Spectral Width (Fwhm)（nm）
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95% Power Within NA（NA）
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Conversion Efficiency（%）
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Threshold Current（A）
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Operating Current（A）
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Operating Voltage（V）
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Core Diameter（μm）
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Fiber Clad Diameter（μm）
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Operating Temp.（°C）
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Storage Temp.（°C）
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Dimension（mm）
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Weight（g）
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1060-15W
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Output Power（W）15
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Central Emission Wavelength（nm）1060±10
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Spectral Width (Fwhm)（nm）6
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95% Power Within NA（NA）0.2
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Conversion Efficiency（%）50
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Threshold Current（A）2
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Operating Current（A）10
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Operating Voltage（V）4.2
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Core Diameter（μm）200
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Fiber Clad Diameter（μm）220
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Operating Temp.（°C）15~40
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Storage Temp.（°C）-20~85
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Dimension（mm）71×42×11.02
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Weight（g）≈87.8
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1060-70W
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Output Power（W）70
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Central Emission Wavelength（nm）1060±10
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Spectral Width (Fwhm)（nm）6
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95% Power Within NA（NA）0.2
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Conversion Efficiency（%）50
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Threshold Current（A）2
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Operating Current（A）10
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Operating Voltage（V）14
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Core Diameter（μm）400
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Fiber Clad Diameter（μm）440
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Operating Temp.（°C）15~40
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Storage Temp.（°C）-20~85
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Dimension（mm）119.5×48×17
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Weight（g）≈310
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