Silicon Transmission Series Detection Module
Photoluminescence (PL) testing is a non-contact inspection method based on optical excitation and high-sensitivity camera imaging, widely used for quality inspection of silicon wafers, solar cells, and other semiconductor materials.
-
10WOutput Power
-
1064±5nmCentral Emission Wavelength
-
10nmSpectral Width
-
Product Advantages
-
Applications
-
Specification
-
Related Products
Product Advantages
-
Non-Contact Inspection
PL testing employs a non-destructive approach, ensuring zero physical damage or contamination to silicon wafers while maintaining sample integrity during inspection.
-
High Sensitivity
Capable of detecting defects and impurities at micron- and even nano-scale levels, PL testing offers significantly higher sensitivity than conventional methods.
-
Rapid and Efficient
PL testing enables high-throughput sample processing, dramatically improving production efficiency and quality control effectiveness.
Applications
-
Inspection Module Camera Capture Diagram -
PV Inspection Module -
PV Inspection
Specification
-
450nm—100W
vs
-
Model Number（W）
-
Wavelength（nm）
-
Center Wavelength Deviation
-
Average Power（W）
-
Typical Working Distance（mm）
-
Dimensions of the Optical Outlet（mm）
-
Detectable Wafer Size（mm）
-
Power Requirements（V）
-
IO Interface
-
Average Power Consumption（W）
-
Outgoing Light Control Mode
-
Power Regulation Mode
-
Operating Temp.&Rh（℃）
-
Controller Size（mm）
-
Optical Module Size（mm）
-
Weight（kg）
-
Applicable Technology
-
450nm—100W
-
Model Number（W）15
-
Wavelength（nm）1064
-
Center Wavelength Deviation±5
-
Average Power（W）15
-
Typical Working Distance（mm）10~25
-
Dimensions of the Optical Outlet（mm）280×10
-
Detectable Wafer Size（mm）≤230
-
Power Requirements（V）220
-
IO InterfaceWhite 0~24V+/ Black 0~0.5V-
-
Average Power Consumption（W）150
-
Outgoing Light Control ModeCode SwitchIO Interface
-
Power Regulation ModeCode Switch
-
Operating Temp.&Rh（℃）20~30；＜80%
-
Controller Size（mm）218×122×111
-
Optical Module Size（mm）316×33×138
-
Weight（kg）≈4
-
Applicable TechnologyRaw Silicon Wafers and Tufting Wafers
-
Related Products
-
COS Encapsulated Semiconductor LaserAdd comparisonvs- 808
- 880
- 915
- 976
COS Encapsulatedtechnology offers high efficiency, low thermal resistance, and enhanced reliability, applicable in industrial processing, medical equipment, and communications fields
-
915nm Semiconductor LaserAdd comparisonvs- 915-15
- 915-45
- 915-150
- 915-480
Suitable for fiber laser pumping applications across industrial processing, medical, cosmetic, and scientific research sectors
-
976nm Semiconductor LaserAdd comparisonvs- 976-150W
- 976-200W
- 976-280W
- 976-450W
Near-infrared laser equipment, used as a pump source for fiber lasers
-
808nm Semiconductor LaserAdd comparisonvs- 808-8W
- 808-16W
- 808-25W
- 808-50W
Near-infrared lasers serving as solid-state laser pumping sources
-
880nm Semiconductor LaserAdd comparisonvs- 880-8W
- 880-30W
- 880-65W
- 880-120W
High-efficiency laser equipment in the near-infrared band, also serving as a pump source for solid-state lasers
-
1060nm Semiconductor LaserAdd comparisonvs- 1060-15W
- 1060-70W
Used for quality inspection of silicon wafers, solar cells, and other semiconductor materials
-
1470nm Semiconductor LaserAdd comparisonvs- 1470-10W
High efficiency and excellent stability, 1470nm widely used in medical, cosmetic, and scientific research fields
-
1550nm Red Light Semiconductor LaserAdd comparisonvs- 1550nm-15W-R-200μm
- 1550nm-25W-R-200μm
High-power, visible light marking, widely used in material processing, medical equipment, and scientific research experiments
-
450nm - 100W High Power Diode LaserAdd comparisonvs- 450nm—100W
Utilizing blue laser wavelengths, it features high output power, excellent stability, and high efficiency
-
Silicon Transmission Series Detection ModuleAdd comparisonvs- 450nm—100W
Widely used for quality inspection of silicon wafers, solar cells, and other semiconductor materials
-
200W Red Light Series Semiconductor LaserAdd comparisonvs- 200W Laser Light Source
Widely used in material processing, medical equipment, and scientific research experiments
-
30W Fiber Coupled High Power LaserAdd comparisonvs- Fiber Coupled High Power Laser 30W
Utilizing blue light wavelengths, applied in material processing, display technology, laser imaging, etc.
-
30W-200W Semiconductor LaserAdd comparisonvs- JPT-30W
- JPT-50W
- JPT-200W
Used for quality inspection of silicon wafers, solar cells
-
50W Square Light Semiconductor LaserAdd comparisonvs- 50W Diode Laser Source (Square Light Spot)
Utilizes a fiber-coupled diode laser source with integrated precision control circuitry
