TWE Tester
The TWE Transmitted Wavefront Error (TWE) Bench Tester adopts a dual optical path measurement architecture, delivering high precision, wide dynamic range, and direct aberration measurement capability. The system enables rapid switching between optical configurations and provides accurate characterization and quality control of the transmitted wavefront quality of optical components, including lenses, filters, and flat optical glass.
TWE Tester is widely used to evaluate the optical performance of components as light propagates through them and reflects the overall impact of surface and material errors on system performance. Using advanced reconstruction algorithms, the system rebuilds the complete wavefront phase map in real time, enabling precise quantification of key optical performance parameters such as PV, RMS, PSF and MTF.
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10 nm RMSAbsolute Accuracy
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<20 mmInter-plate difference PV
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< 2 nm RMSPhase Resolution
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Product Advantages
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Applications
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Specifications
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Application Solutions
Product Advantages
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High-Precision Wavefront Measurement
Supports 10 nm RMS resolution, enabling accurate capture of transmitted wavefront information and imaging quality of optical components.
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Multi-functional Testing Platform
Compatible with both flat optics and lens-type components. The modular quick-change holder system allows rapid adaptation to optical components of different sizes and specifications.
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Non-contact High-Speed Inspection
A high-stability optical measurement system ensures fast data acquisition and excellent measurement repeatability without contacting the optical surface.
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Customizable Wavelength and Report Output
Supports multi-wavelength testing with quick switching between spectral bands. Custom automated report generation and data visualization are available through the integrated software.
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Compact and Efficient Integration
The modular and space-saving design integrates with a visualized software interface, providing intuitive operation and improved testing efficiency.
Applications
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Cover Glass Measurement -
Lens Testing -
Lens Testing
Specifications
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TWE Bench Tester
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Wavelength Range
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Aperture Size
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Spatial Resolution
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Phase Resolution
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Wavefront Error
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Absolute Accuracy
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Acquisition Speed
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Real-time Processing Speed
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Electrical Specifications
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Dimensions
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Weight
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Communication Interface
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Air Pressure
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Operating Temperature
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Operating Humidity
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Cleanliness Level
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TWE Bench Tester
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Wavelength Range400 ~ 1100 nm
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Aperture Size5.02 mm × 3.75 mm
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Spatial Resolution27.6 μm (depending on beam expander)
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Phase Resolution< 2 nm RMS (depending on beam expander)
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Wavefront ErrorPV: 15–20 nm; RMS: 0–4 nm
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Absolute Accuracy10 nm RMS
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Acquisition Speed60 FPS
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Real-time Processing Speed10 FPS (full resolution)
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Electrical SpecificationsPower Supply: AC 220 V, 50 Hz;
Power Consumption: 100 W;
Rated Current: 0.5 A (Max 1 A) -
Dimensions430 mm × 430 mm × 884.5 mm
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Weight55 kg
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Communication InterfaceEthernet Port, USB 3.0
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Air Pressure0.5–0.7 MPa, Φ10 mm
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Operating Temperature15 ~ 35 °C
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Operating Humidity40 ~ 65%
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Cleanliness LevelClass 100 / 1000 / 10000
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