• TWE Bench Tester.png
    TWE Bench Tester
  • TWE Bench Tester.png

TWE Bench Tester

The four-wave shearing sensor can be used to measure optical wavefronts, enabling the evaluation of optical component performance (such as PV, RMS, MTF, aberrations, spherical aberration, etc.) when illuminated by monochromatic light of different wavelengths.

  • 400-1100nm
    Test wavelength range
  • 5.02×3.75mm
    Test aperture size
  • <2 nm RMS
    Test resolution (phase)
  • Product Advantages

  • Specifications

  • Application Solutions

Product Advantages

  • High-Precision Measurement

    10 nm RMS ultra-high resolution delivers highly accurate and reliable testing results.

  • Fast & Non-Destructive Testing

    Non-contact optical technology enables rapid data acquisition with excellent repeatability, ensuring no damage to samples.

  • Versatile & Flexible Capability

    Compatible with both flat surfaces and lenses, with quick-change holders for easy adaptation to different product sizes and applications.

  • Customizable Wavelength Options

    Supports single-wavelength testing with adjustable wavelength configurations to meet diverse inspection needs.

  • Intelligent Software & Reporting

    Provides customizable data visualization and one-click professional report generation, improving analysis efficiency.

  • Compact & User-Friendly Design

    Modular integration saves space, while an intuitive interface ensures simple operation and enhanced productivity.

Specifications

Product Model
  • TWE Bench Tester
    TWE Bench Tester.png
  • Measure Wavelength Range
  • Size
  • Aperture Size
  • Phase Spatial Resolution
  • Resolution (phase)
  • Accuracy (absolute)
  • Acquisition frequency
  • Real Time Processing Frequency
  • Interface
  • Measurement System Weight
  • Loading/unloading mode
  • Precise motion control
  • Power supply
  • Gas Source
  • Power
  • Rated Current
  • Appearance Dimensions
  • Equipment Weight
  • TWE Bench Tester

    TWE Bench Tester.png
    • Measure Wavelength Range
      400-1100 nm
    • Size
      62 mm×64 mm×94 mm
    • Aperture Size
      5.02 mm × 3.75 mm
    • Phase Spatial Resolution
      27.6 μm-77.28 μm (depending on the beam expander)
    • Resolution (phase)
      <4 nm RMS
    • Accuracy (absolute)
      10 nm RMS
    • Acquisition frequency
      60 fps
    • Real Time Processing Frequency
      10 fps (full resolution)
    • Interface
      Gigabit Ethernet
    • Measurement System Weight
      ~400 g
    • Loading/unloading mode
      Manual loading and unloading
    • Precise motion control
      Manual slide table; Quickly replace the Holder system
    • Power supply
      AC 220 V,50 Hz
    • Gas Source
      non
    • Power
      100 W
    • Rated Current
      0.5 A(MAX 1A)
    • Appearance Dimensions
      430 mm×430 mm×884.5 mm
    • Equipment Weight
      55 kg

Please fill in your information

Get relevant resources
  • I have read and agree to the Privacy Policy
  • Submit