Company News
Lecture About Introduction to Optical Metrology
On Dec. 14, 2011,JPT organization hold the academic lectureabout an Introduction to Optical Metrology. We adivised the Dr. Zhang, who isfrom National Metrology Centre, Agency for Science, Technology andResearch, Singapore. The lecture lasts two hours and includes the title aboutLight power measurement and light detectors and so on. During the lecture, JPTmanager Kevin , R&D manager Penn and other department colleagues attendedthis lecture. All members learned each other and made progress together.
Related recommendations
-
JPT 2024 Annual Report: Revenue Reaches a Historic High2025-04-03
-
JPT Skills Competition 2024 comes to a successful conclusion2024-11-13
-
"The Unseen Champion" Chronicle: JPT Strives to be the Leader in the Laser Technology Subdivision2024-08-30
-
Good news | JPT won another industry award2024-08-29