M7 20W/30W
M7 60W/100W
M7 200W/350W
LP 20W/30W/50W
CL 100W/200W/300W
CW 200W/300W
CW 500W-1000W
CW 4000W-6000W
QCW 150W/1500W
CW 8000W/12000W
CW 1500W-3000W
SEAL 355
SEAL 532
LARK 355
PS IR/UV Picosecond Laser
SEAL 355-20S
915nm/976nm - 240W - 135μm
915nm - 280W - 135μm
976nm - 420W - 200μm
976nm - 500W - 200μm
450nm - 15W - 105μm
915nm - 15W - 105μm
915nm - 30W - 105μm
915nm - 45W - 105μm
915nm - 60W - 105μm
915nm - 110W - 105μm
Laser Scriber
Single Chip Resistor Tester
Laser Trimmer
Hybrid Trimmer
HiPA-TT Light Transmittance Tester
PCB Laser Marking System
Ghost Writer & Reader - Subsurface 2D Barcode Marking & Reading System
High Precision 2DBC Laser-marking
Comprehensive VCSEL Module tester
Comprehensive LED-PD Integrated Module Testing
Six-sided Inspection Machine
High Voltage Resistor Tester
1.It adopts a customized fiber laser to provide customers with the best cost performance
2.Self-developed measurement / control system, with independent intellectual property rights
3.Self-developed sotiware operating system for customization
4.The detection resistance range is 1Ω -10MΩ
5.Using RS-232 interface, AC / DC power supply can be programmed
The high-voltage tester is mainly used for short-term overload (STOL) test of high-quality and high-precision chip resistors. The resistance change before and atier the high-voltage test is compared by the measurement system, and the bad resistors are screened out and cut through by laser to reduce the risk of resistance instability. Customers can edit the test conditions to meet the quality requirements of different specifications of resistors. It is an efficient high-voltage method with a screening function.
| Parameter |
Model | JS-M100-HVF |
Specifications | 0402 and above |
Measuring range | 1Ω-10M |
Maximum voltage | 600V |
High voltage protection | Over current fusing alarm |
Laser power | 20W/30W |
Beam expander | 2X |
Focal length of field mirror | 125mm |
Scanning accuracy of galvanometer | ±1μm |
Repeated clamping accuracy of platiorm | ≤5μm |
Positioning accuracy of carrier motion | 1μm |
Measurement channel | 192 |
Fixed mode of probe card | Adjustable horizontal plane |
